Integrated Over-Temperature Protection Circuit for GaN Smart Power ICs
Kwan, Alex Man Ho; Guan, Yue; Liu, Xiaosen; Chen, Kevin J.
- 期刊名称Japanese Journal of Applied Physics
- 作者Kwan, Alex Man Ho; Guan, Yue; Liu, Xiaosen; Chen, Kevin J.
- 卷第52卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小1126.61KB
- 发表时间2013-08-01
- DOI10.7567/jjap.52.08jn15