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Leakage Current Suppression by Passivation of Defects by Anodic Oxidation of 4H-SiC Schottky Contacts

Leakage Current Suppression by Passivation of Defects by Anodic Oxidation of 4H-SiC Schottky Contacts

Kato, Masashi; Kimura, Masaya; Ichimura, Masaya
  • 期刊名称Japanese Journal of Applied Physics
  • 作者Kato, Masashi; Kimura, Masaya; Ichimura, Masaya
  • 卷第52卷
  • 印刷ISSN0021-4922
  • 电子ISSN1347-4065
  • 文件大小414.40KB
  • 发表时间2013-04-01
  • DOI10.7567/JJAP.52.04CP02
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