Ultrahigh-Voltage SiC PiN Diodes with an Improved Junction Termination Extension Structure and Enhanced Carrier Lifetime
- 期刊名称Japanese Journal of Applied Physics
- 作者Kaji, Naoki; Niwa, Hiroki; Suda, Jun; Kimoto, Tsunenobu
- 卷第52卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小117.76KB
- 发表时间2013-07-01
- DOI10.7567/JJAP.52.070204
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