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[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Degradation behaviour of solid insulation under cryogenic conditions

[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Degradation behaviour of solid insulation under cryogenic conditions

Truong, L. H.; Lewin, P. L.

作者Truong, L. H.; Lewin, P. L.
文件大小1481.90KB
发表时间2013
DOI10.1109/icsd.2013.6619753
页码640-643

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