[ACM Press the ACM SIGMETRICS/international conference - Pittsburgh, PA, USA (2013.06.17-2013.06.21)] Proceedings of the ACM SIGMETRICS/international conference on Measurement and modeling of computer systems - SIGMETRICS '13 - Characterizing the impact of process variation on write endurance enhancing techniques for non-volatile memory systems
- 作者Cintra, Marcelo; Linkewitsch, Niklas
- 文件大小2341.06KB
- 发表时间2013
- DOI10.1145/2465529.2465755
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