[ACM Press the 45th annual ACM symposium - Palo Alto, California, USA (2013.06.01-2013.06.04)] Proceedings of the 45th annual ACM symposium on Symposium on theory of computing - STOC '13 - Every locally characterized affine-invariant property is testable
Bhattacharyya, Arnab; Fischer, Eldar; Hatami, Hamed; Hatami, Pooya; Lovett, Shachar
- 作者Bhattacharyya, Arnab; Fischer, Eldar; Hatami, Hamed; Hatami, Pooya; Lovett, Shachar
- 文件大小617.61KB
- 发表时间2013
- DOI10.1145/2488608.2488662