Polynomial force approximations and multifrequency atomic force microscopy
Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A; Haviland, David B
- 期刊名称Beilstein Journal of Nanotechnology
- 作者Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A; Haviland, David B
- 卷第4卷
- 电子ISSN2190-4286
- 文件大小2301.33KB
- 发表时间2013-06-10
- DOI10.3762/bjnano.4.41
- 页码352-360