The problem with knowledge ambiguity
- 期刊名称European Management Journal
- 作者Law, Kuok Kei
- 卷第32卷
- 期第3期
- 印刷ISSN0263-2373
- 文件大小398.67KB
- 发表时间2014-06
- DOI10.1016/j.emj.2013.07.010
- 页码444-450
[IEEE 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Ipoh, Perak, Malaysia (2012.11.6-2012.11.8)] 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Characterization of mechanical testing on lead free solder on electronic applicationErvina, Efzan M.N.; Singh, Amares · 2012
[IEEE 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Ipoh, Perak, Malaysia (2012.11.6-2012.11.8)] 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Success story in driving quality enhancements in the indirect materials used in assembly/test electronic packaging manufacturingChandran, Dennis Prem Kumar; Ong Chee Teong, ; Razai, Mohd Jaffri · 2012
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - System integration -The bridge between More than Moore and More MooreHeinig, Andy; Dietrich, Manfred; Herkersdorf, Andreas; Miller, Felix; Wild, Thomas; Hahn, Kai; Grunewald, Armin; Bruck, Rainer; Krohnert, Steffen; Reisinger, Jochen · 2014
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - System integration -The bridge between More than Moore and More MooreHeinig, Andy; Dietrich, Manfred; Herkersdorf, Andreas; Miller, Felix; Wild, Thomas; Hahn, Kai; Grunewald, Armin; Bruck, Rainer; Krohnert, Steffen; Reisinger, Jochen · 2014
[IEEE 2019 International Symposium on Signals, Circuits and Systems (ISSCS) - Iasi, Romania (2019.7.11-2019.7.12)] 2019 International Symposium on Signals, Circuits and Systems (ISSCS) - A Wafer Yield Fluctuation Analysis Model Utilizing Least-Squares Spectral AnalysisWeber, Christian; Fathi, Madjid; Grunewald, Armin; Hahn, Kai; Bruck, Rainer; Montino, Ralf; Krumm, Roland · 2019