Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
- 期刊名称Journal of Electronic Testing
- 作者Guin, Ujjwal; DiMase, Daniel; Tehranipoor, Mohammad
- 卷第30卷
- 期第1期
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小671.08KB
- 发表时间2014-02
- DOI10.1007/s10836-013-5430-8
- 页码9-23
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