Nanoscale characterisation of semiconductors by cathodoluminescence
- 期刊名称IOP Conference Series: Materials Science and Engineering
- 作者Thonke, K; Tischer, I; Hocker, M; Schirra, M; Fujan, K; Wiedenmann, M; Schneider, R; Frey, M; Feneberg, M
- 卷第55卷
- 电子ISSN1757-899X
- 文件大小5773.82KB
- 发表时间2014-03-05
- DOI10.1088/1757-899X/55/1/012018
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