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Arrhenius behavior of electron attachment to CH3Br from 303 to 1100K

Arrhenius behavior of electron attachment to CH3Br from 303 to 1100K

Miller, Thomas M.; Shuman, Nicholas S.; Viggiano, Albert A.
  • 期刊名称International Journal of Mass Spectrometry
  • 作者Miller, Thomas M.; Shuman, Nicholas S.; Viggiano, Albert A.
  • 印刷ISSN1387-3806
  • 文件大小636.46KB
  • 发表时间2014-05
  • DOI10.1016/j.ijms.2013.12.006
  • 页码75-79
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