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Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization

Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization

Ilday, Serim; Nogay, Gizem; Turan, Rasit

期刊名称Applied Surface Science
作者Ilday, Serim; Nogay, Gizem; Turan, Rasit
卷第318卷
印刷ISSN0169-4332
文件大小2200.65KB
发表时间2014-11
DOI10.1016/j.apsusc.2014.04.153
页码256-261

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