![SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII - Measuring the propagation of entanglement and information in dispersive media]()
SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII - Measuring the propagation of entanglement and information in dispersive mediaShahriar, Selim M.; Scheuer, Jacob; Clark, Jeremy B.; Glasser, Ryan T.; Glorieux, Quentin; Vogl, Ulrich; Li, Tian; Jones, Kevin M.; Lett, Paul D. · 2015