Survey on Voltage Dip Measurements in Standard Framework
Gallo, Daniele; Landi, Carmine; Luiso, Mario; Fiorucci, Edoardo
- 期刊名称IEEE Transactions on Instrumentation and Measurement
- 作者Gallo, Daniele; Landi, Carmine; Luiso, Mario; Fiorucci, Edoardo
- 卷第63卷
- 期第2期
- 印刷ISSN0018-9456
- 电子ISSN1557-9662
- 文件大小6233.64KB
- 发表时间2014-02
- DOI10.1109/TIM.2013.2278996
- 页码374-387