Robust HSPICE modeling of a single electron turnstile
- 期刊名称Microelectronics Journal
- 作者Wei, Wei; Han, Jie; Lombardi, Fabrizio
- 卷第45卷
- 期第4期
- 印刷ISSN0026-2692
- 文件大小2538.89KB
- 发表时间2014-04
- DOI10.1016/j.mejo.2014.01.014
- 页码394-407
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