Ti/Al ohmic contacts on AlGaN/GaN heterostructures with different defect density
- 期刊名称Applied Surface Science
- 作者Greco, Giuseppe; Iucolano, Ferdinando; Bongiorno, Corrado; Giannazzo, Filippo; Krysko, Marcin; Leszczynski, Mike; Roccaforte, Fabrizio
- 卷第314卷
- 印刷ISSN0169-4332
- 文件大小1588.32KB
- 发表时间2014-09
- DOI10.1016/j.apsusc.2014.07.018
- 页码546-551
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