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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - A wear-leveling-aware dynamic stack for PCM memory in embedded systems

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - A wear-leveling-aware dynamic stack for PCM memory in embedded systems

Li, Qingan; He, Yanxiang; Chen, Yong; Xue, Chun Jason; Jiang, Nan; Xu, Chao

作者Li, Qingan; He, Yanxiang; Chen, Yong; Xue, Chun Jason; Jiang, Nan; Xu, Chao
文件大小231.51KB
发表时间2014
DOI10.7873/date.2014.102
页码1-4

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