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[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Process parameter calibration for millimeter-wave CMOS back-end device design with electromagnetic field analysis

[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Process parameter calibration for millimeter-wave CMOS back-end device design with electromagnetic field analysis

Amakawa, S.; Orii, A.; Katayama, K.; Takano, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.
  • 作者Amakawa, S.; Orii, A.; Katayama, K.; Takano, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.
  • 文件大小2628.40KB
  • 发表时间2014
  • DOI10.1109/icmts.2014.6841490
  • 页码182-187
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