[IEEE 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Waikoloa, HI, USA (2014.6.15-2014.6.19)] 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Advanced 300mm 0.13μm BCD technology from 5V to 80V with highly reliable embedded Flash

Iwamoto, K.; Kori, M.; Terada, C.; Doguchi, T.; Mihara, M.; Kasa, Y.; Ukai, K.; Ujiie, Y.; Uehara, H.; Hamanaka, C.; Tanaka, B.; Wada, K.; Shimizu, S.; Shukuri, S.; Izumi, N.; Mifuji, M.

作者Iwamoto, K.; Kori, M.; Terada, C.; Doguchi, T.; Mihara, M.; Kasa, Y.; Ukai, K.; Ujiie, Y.; Uehara, H.; Hamanaka, C.; Tanaka, B.; Wada, K.; Shimizu, S.; Shukuri, S.; Izumi, N.; Mifuji, M.
文件大小1619.84KB
发表时间2014
DOI10.1109/ispsd.2014.6856061
页码402-405

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