[IEEE 2014 IEEE 6th International Memory Workshop (IMW) - Taipei, Taiwan (2014.5.18-2014.5.21)] 2014 IEEE 6th International Memory Workshop (IMW) - Statistical modeling of electrochemical metallization memory cells
- 作者Menzel, S.; Valov, I.; Waser, R.; Wolf, B.; Tappertzhofen, S.; Bottger, U.
- 文件大小725.13KB
- 发表时间2014
- DOI10.1109/imw.2014.6849360
- 页码1-4
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