Deterministic electron ptychography at atomic resolution
- 期刊名称Physical Review B
- 作者D'Alfonso, A. J.; Morgan, A. J.; Yan, A. W. C.; Wang, P.; Sawada, H.; Kirkland, A. I.; Allen, L. J.
- 卷第89卷
- 期第6期
- 印刷ISSN1098-0121
- 电子ISSN1550-235X
- 文件大小5422.30KB
- 发表时间2014-2-3
- DOI10.1103/physrevb.89.064101
[IEEE 2009 67th Annual Device Research Conference (DRC) - University Park, PA, USA (2009.06.22-2009.06.24)] 2009 Device Research Conference - 67<sup>th</sup> DRC late news papers2009
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