Image correction for atomic force microscopy images with functionalized tips
- 期刊名称Physical Review B
- 作者Neu, M.; Moll, N.; Gross, L.; Meyer, G.; Giessibl, F. J.; Repp, J.
- 卷第89卷
- 期第20期
- 印刷ISSN1098-0121
- 电子ISSN1550-235X
- 文件大小1432.06KB
- 发表时间2014-5-7
- DOI10.1103/physrevb.89.205407
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