[IEEE 2014 15th International Conference on Electronic Packaging Technology (ICEPT) - Chengdu, China (2014.8.12-2014.8.15)] 2014 15th International Conference on Electronic Packaging Technology - Study on the board-level drop test of the stacked memory device by FEA
Pang, Junwen; Wang, Jun; Zhao, Liyou
- 作者Pang, Junwen; Wang, Jun; Zhao, Liyou
- 文件大小514.27KB
- 发表时间2014
- DOI10.1109/icept.2014.6922753
- 页码724-727