[IEEE 2014 IEEE International Symposium on Ethics in Engineering, Science, and Technology (ETHICS) - Chicago, IL, USA (2014.5.23-2014.5.24)] 2014 IEEE International Symposium on Ethics in Science, Technology and Engineering - Forensic metrology: when measurement science meets ethics
Ferrero, Alessandro; Scotti, Veronica
- 作者Ferrero, Alessandro; Scotti, Veronica
- 文件大小103.83KB
- 发表时间2014
- DOI10.1109/ethics.2014.6893377
- 页码1-6