发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

FAULT DETECTION FOR THE CLASS IMBALANCE PROBLEM IN SEMICONDUCTOR MANUFACTURING PROCESSES

FAULT DETECTION FOR THE CLASS IMBALANCE PROBLEM IN SEMICONDUCTOR MANUFACTURING PROCESSES

WANG, JIAN; FENG, JIAN; HAN, ZHIYAN
  • 期刊名称Journal of Circuits, Systems and Computers
  • 作者WANG, JIAN; FENG, JIAN; HAN, ZHIYAN
  • 卷第23卷
  • 期第4期
  • 印刷ISSN0218-1266
  • 电子ISSN1793-6454
  • 文件大小334.74KB
  • 发表时间2014-04
  • DOI10.1142/S0218126614500492
← 返回【学霸图书馆】主页