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Analysis of image distortion on projection electron microscope image

Iida, Susumu; Hirano, Ryoichi; Terasawa, Tsuneo; Amano, Tsuyoshi; Watanabe, Hidehiro

期刊名称Japanese Journal of Applied Physics
作者Iida, Susumu; Hirano, Ryoichi; Terasawa, Tsuneo; Amano, Tsuyoshi; Watanabe, Hidehiro
卷第53卷
期第11期
印刷ISSN0021-4922
电子ISSN1347-4065
文件大小803.14KB
发表时间2014-11-01
DOI10.7567/JJAP.53.116602