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Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

Guin, Ujjwal; Huang, Ke; DiMase, Daniel; Carulli, John M.; Tehranipoor, Mohammad; Makris, Yiorgos

期刊名称Proceedings of the IEEE
作者Guin, Ujjwal; Huang, Ke; DiMase, Daniel; Carulli, John M.; Tehranipoor, Mohammad; Makris, Yiorgos
卷第102卷
期第8期
印刷ISSN0018-9219
电子ISSN1558-2256
文件大小3972.45KB
发表时间2014-8
DOI10.1109/jproc.2014.2332291
页码1207-1228