High frequency measurement techniques for vias in printed circuit boards
Kotzev, Miroslav; Kwark, Young H.; Muller, Sebastian; Hardock, Andreas; Rimolo-Donadio, Renato; Baks, Christian; Schuster, Christian
- 期刊名称IEEE Electromagnetic Compatibility Magazine
- 作者Kotzev, Miroslav; Kwark, Young H.; Muller, Sebastian; Hardock, Andreas; Rimolo-Donadio, Renato; Baks, Christian; Schuster, Christian
- 卷第3卷
- 期第4期
- 印刷ISSN2162-2264
- 电子ISSN2162-2272
- 文件大小3734.82KB
- 发表时间2014
- DOI10.1109/memc.2014.7023212
- 页码104-113