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[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Characterization of data retention faults in DRAM devices

[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Characterization of data retention faults in DRAM devices

Bacchini, Angelo; Rovatti, Marco; Furano, Gianluca; Ottavi, Marco
  • 作者Bacchini, Angelo; Rovatti, Marco; Furano, Gianluca; Ottavi, Marco
  • 文件大小908.42KB
  • 发表时间2014
  • DOI10.1109/DFT.2014.6962069
  • 页码9-14
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