SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Design and Testing VI - Calculation of Mueller matrix for light scattering from randomly rough surface
- 作者Wang, Yongtian; Du, Chunlei; Sasián, José; Tatsuno, Kimio; Yan, Keding; Wang, Shouyu; Jiang, Shu; Xue, Liang; Song, Yuanyuan; Yan, Zhengang; Li, Zhenhua
- 卷第9272卷
- 印刷ISSN0277-786X
- 文件大小583.51KB
- 发表时间2014
- DOI10.1117/12.2070971
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