Structural characterization of polycrystalline Ge thin films on insulators formed by diffusion-enhanced Al-induced layer exchange
Numata, Ryohei; Toko, Kaoru; Oya, Naoki; Usami, Noritaka; Suemasu, Takashi
- 期刊名称Japanese Journal of Applied Physics
- 作者Numata, Ryohei; Toko, Kaoru; Oya, Naoki; Usami, Noritaka; Suemasu, Takashi
- 卷第53卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小1105.71KB
- 发表时间2014-04-01
- DOI10.7567/JJAP.53.04EH03