[IEEE 2014 International Conference on 3D Imaging (IC3D) - Liege, Belgium (2014.12.9-2014.12.10)] 2014 International Conference on 3D Imaging (IC3D) - Disparity map quality for image-based rendering based on multiple metrics
Vandewalle, Patrick; Varekamp, Chris
- 作者Vandewalle, Patrick; Varekamp, Chris
- 文件大小363.92KB
- 发表时间2014
- DOI10.1109/IC3D.2014.7032599
- 页码1-5