Effect of charge trapping on effective carrier lifetime in compound semiconductors: High resistivity CdZnTe
- 期刊名称Journal of Applied Physics
- 作者Kamieniecki, Emil
- 卷第116卷
- 期第19期
- DOI210.0000/www.researchgate.net/268521416
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小650.50KB
- 发表时间2014-11-21
- DOI10.1063/1.4901826
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