[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Aging analysis for recycled FPGA detection

• 作者Dogan, Halit; Forte, Domenic; Tehranipoor, Mark Mohammad
• 文件大小1462.37KB
• 发表时间2014
• DOI10.1109/dft.2014.6962099
• 页码171-176