AIP Conference Proceedings [AIP Publishing LLC PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON MATHEMATICAL SCIENCES - Kuala Lumpur, Malaysia (17–19 December 2013)] - Electromigration void nucleation and growth analysis using large-scale early failure statistics
Hauschildt, M.; Gall, M.; Hennesthal, C.; Talut, G.; Aubel, O.; Yeap, K. B.; Zschech, E.
- 作者Hauschildt, M.; Gall, M.; Hennesthal, C.; Talut, G.; Aubel, O.; Yeap, K. B.; Zschech, E.
- 印刷ISSN0094-243X
- 文件大小1003.08KB
- 发表时间2014
- DOI10.1063/1.4881343
- 页码89-98