[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - On-chip constrained random stimuli generation for post-silicon validation using compact masks
- 作者Shi, Xiaobing; Nicolici, Nicola
- 文件大小1941.43KB
- 发表时间2014
- DOI10.1109/TEST.2014.7035337
- 页码1-10
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