[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - High sensitivity image sensor overlaid with thin-film crystalline-selenium-based heterojunction photodiode
Imura, S.; Kikuchi, K.; Miyakawa, K.; Ohtake, H.; Kubota, M.; Nakada, T.; Okino, T.; Hirose, Y.; Kato, Y.; Teranishi, N.
- 作者Imura, S.; Kikuchi, K.; Miyakawa, K.; Ohtake, H.; Kubota, M.; Nakada, T.; Okino, T.; Hirose, Y.; Kato, Y.; Teranishi, N.
- 文件大小765.79KB
- 发表时间2014
- DOI10.1109/IEDM.2014.7046981