[IEEE 2014 IEEE International Microwave and RF Conference (IMaRC) - Bangalore, India (2014.12.15-2014.12.17)] 2014 IEEE International Microwave and RF Conference (IMaRC) - Chipless RFID based high resolution crack sensing through SWB technology
- 作者Dey, Shuvashis; Kalansuriya, Prasanna; Karmakar, Nemai Chandra
- 文件大小678.94KB
- 发表时间2014
- DOI10.1109/IMaRC.2014.7039040
- 页码330-333
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