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[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs

Agrawal, Mukesh; Chakrabarty, Krishnendu; Eklow, Bill

作者Agrawal, Mukesh; Chakrabarty, Krishnendu; Eklow, Bill
文件大小535.66KB
发表时间2014
DOI10.1109/TEST.2014.7035333
页码1-10

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