SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 1 February 2014)] Lasers in Dentistry XX - Near-IR imaging of cracks in teeth
Rechmann, Peter; Fried, Daniel; Fried, William A.; Simon, Jacob C.; Lucas, Seth; Chan, Kenneth H.; Darling, Cynthia L.; Staninec, Michal; Fried, Daniel
- 作者Rechmann, Peter; Fried, Daniel; Fried, William A.; Simon, Jacob C.; Lucas, Seth; Chan, Kenneth H.; Darling, Cynthia L.; Staninec, Michal; Fried, Daniel
- 卷第8929卷
- 印刷ISSN0277-786X
- 文件大小594.95KB
- 发表时间2014
- DOI10.1117/12.2045686