Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy
- 期刊名称Microscopy and Microanalysis
- 作者Schmidt, S. S.; Dietrich, J.; Koch, C. T.; Schaffer, B.; Schaffer, M.; Klingsporn, M.; Merdes, S.; Abou-Ras, D.
- 卷第20卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小1250.56KB
- 发表时间2014-08
- DOI10.1017/s1431927614004371
- 页码530-531
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