SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors - Optimized dithering technique for 3D shape measurement based on intensity residual error
Czarske, Jurgen; Zhang, Shulian; Sampson, David; Wang, Wei; Liao, Yanbiao; Sun, Jiasong; Zhang, Yuzhen; Zuo, Chao; Feng, Shijie; Yu, ShiLing; Chen, Qian
- 作者Czarske, Jurgen; Zhang, Shulian; Sampson, David; Wang, Wei; Liao, Yanbiao; Sun, Jiasong; Zhang, Yuzhen; Zuo, Chao; Feng, Shijie; Yu, ShiLing; Chen, Qian
- 卷第9297卷
- 印刷ISSN0277-786X
- 文件大小253.58KB
- 发表时间2014
- DOI10.1117/12.2071895