![SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Phase shift based measurements using a pocket LCD projector]()
SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Phase shift based measurements using a pocket LCD projectorWilliams, Yana; Harding, Kevin; Huang, Peisen S.; Harding, Kevin; Yoshizawa, Toru · 2010