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A hybrid estimation of distribution algorithm for the semiconductor final testing scheduling problem

A hybrid estimation of distribution algorithm for the semiconductor final testing scheduling problem

Wang, Shengyao; Wang, Ling; Liu, Min; Xu, Ye

期刊名称Journal of Intelligent Manufacturing
作者Wang, Shengyao; Wang, Ling; Liu, Min; Xu, Ye
卷第26卷
期第5期
印刷ISSN0956-5515
电子ISSN1572-8145
文件大小590.42KB
发表时间2015-10-13
DOI10.1007/s10845-013-0821-3
页码861-871

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