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High-Density and High-Reliability Nonvolatile Field-Programmable Gate Array With Stacked 1D2R RRAM Array

High-Density and High-Reliability Nonvolatile Field-Programmable Gate Array With Stacked 1D2R RRAM Array

Huang, Kejie; Zhao, Rong; He, Wei; Lian, Yong
  • 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • 作者Huang, Kejie; Zhao, Rong; He, Wei; Lian, Yong
  • 印刷ISSN1063-8210
  • 电子ISSN1557-9999
  • 文件大小3085.92KB
  • 发表时间2015
  • DOI10.1109/TVLSI.2015.2389260
  • 页码1-1
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