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Depth-based runs tests for bivariate central symmetry

Depth-based runs tests for bivariate central symmetry

Dyckerhoff, Rainer; Ley, Christophe; Paindaveine, Davy
  • 期刊名称Annals of the Institute of Statistical Mathematics
  • 作者Dyckerhoff, Rainer; Ley, Christophe; Paindaveine, Davy
  • 卷第67卷
  • 期第5期
  • 印刷ISSN0020-3157
  • 电子ISSN1572-9052
  • 文件大小1131.95KB
  • 发表时间2015-10-11
  • DOI10.1007/s10463-014-0480-y
  • 页码917-941
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