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Spetroscopic ellipsometry study on electrical and elemental properties of Sb-doped ZnO thin films

Spetroscopic ellipsometry study on electrical and elemental properties of Sb-doped ZnO thin films

Pandey, Sushil Kumar; Awasthi, Vishnu; Verma, Shruti; Gupta, Mukul; Mukherjee, Shaibal
  • 期刊名称Current Applied Physics
  • 作者Pandey, Sushil Kumar; Awasthi, Vishnu; Verma, Shruti; Gupta, Mukul; Mukherjee, Shaibal
  • 卷第15卷
  • 期第4期
  • 印刷ISSN1567-1739
  • 文件大小1084.12KB
  • 发表时间2015-04
  • DOI10.1016/j.cap.2015.02.008
  • 页码479-485
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