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Modification and reduction of defects in thin gate dielectric of MIS devices by injection-thermal and irradiation treatments

Modification and reduction of defects in thin gate dielectric of MIS devices by injection-thermal and irradiation treatments

Andreev, Vladimir V.; Bondarenko, Gennady G.; Maslovsky, Vladimir M.; Stolyarov, Alexander A.; Andreev, Dmitry V.
  • 期刊名称physica status solidi (c)
  • 作者Andreev, Vladimir V.; Bondarenko, Gennady G.; Maslovsky, Vladimir M.; Stolyarov, Alexander A.; Andreev, Dmitry V.
  • 卷第12卷
  • 印刷ISSN1862-6351
  • 文件大小266.56KB
  • 发表时间2015-01
  • DOI10.1002/pssc.201400151
  • 页码126-130
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