发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Electron Beam Induced Microstructural Changes and Electrical Conductivity in Bakelite RPC Detector Material

Electron Beam Induced Microstructural Changes and Electrical Conductivity in Bakelite RPC Detector Material

Aneesh Kumar, K.V.; Ravikumar, H. B.; Ganesh, S.; Ranganathaiah, C.

期刊名称IEEE Transactions on Nuclear Science
作者Aneesh Kumar, K.V.; Ravikumar, H. B.; Ganesh, S.; Ranganathaiah, C.
卷第62卷
期第1期
印刷ISSN0018-9499
电子ISSN1558-1578
文件大小871.26KB
发表时间2015-2
DOI10.1109/tns.2014.2375916
页码306-313

← 返回【学霸图书馆】主页