Optimum and semi-optimum life test plans of electrical insulation for thermal stress
- 期刊名称IEEE Transactions on Dielectrics and Electrical Insulation
- 作者Hirose, Hideo; Sakumura, Takenori; Tabuchi, Naoki
- 卷第22卷
- 期第1期
- 印刷ISSN1070-9878
- 文件大小468.18KB
- 发表时间2015-2
- DOI10.1109/tdei.2014.004506
- 页码488-494